Automatic Test System for Photonic Chips
We will achieve high-precision and high-efficiency automatic inspection!
We would like to introduce our "Chip-Level Test System." This product is designed for chip-level evaluation of silicon photonics and photonic integrated circuit (PIC) devices. By integrating a sub-micron precision motion control platform and a high-performance vibration isolation system, it enables highly accurate measurements. 【Wide Range of Applications】 ■ Compatible with SiPh chip testing ■ Compatible with TFLN chip testing ■ Compatible with III-V chip testing *For more details, please download the PDF or feel free to contact us.
- Company:日本レーザー
- Price:Other